MICROELECTRONICS RELIABILITY
| Country: | Netherlands |
|---|---|
| Journal ISSN: | 0026-2714 |
| Journal EISSN: | 1872-941Xeissn |
| History | 1962-ongoing |
| Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
| Journal Hompage: | Link |
| Note: |
MICROELECTRONICS RELIABILITY
Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting case studies in the field are particularly encouraged.
Impact Factor Trend 2000 - 2025
The impact factor (IF) or journal impact factor (JIF) of an academic journal is a scientometric factor based on the yearly average number of citations on articles published by a particular journal in the last two years. In other words, the impact factor of 2024 - 2025 is the average of the number of cited publications divided by the citable publications of a journal. A journal impact factor is frequently used as a proxy for the relative importance of a journal within its field. Normally, journals with higher impact factors are often deemed to have more influence than those with lower ones. However, the science community has also noted that review articles typically are more citable than research articles.Here you can check the journal performance trends based on last 20 years of data, also check the latest journal citation reports 2025. Also Check H-Index, SCImago journal rank and journal impact factor 2025.
Read MoreImpact Factor History
Note: impact factor data for reference only
Any journal impact factor or scientometric indicator alone will not give you the full picture of a science journal. That’s why every year, scholars review current metrics to improve upon them and sometimes come up with new ones. There are also other factors to sider for example, H-Index, Self-Citation Ratio, SJR (SCImago Journal Rank Indicator) and SNIP (Source Normalized Impact per Paper). Researchers may also consider the practical aspect of a journal such as publication fees, acceptance rate, review speed.